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Type: 
Book
Description: 
In the last few years the STEM technique in standard SEMs has become a complementary approach to HAADF-STEM at high energy [1, 4], at least when high resolution is not required, as demonstrated by the availability of STEM attachments for all the commercial SEMs.
Publisher: 
Springer, Berlin, Heidelberg
Publication date: 
1 Jan 2008
Biblio References: 
Pages: 581-582
Origin: 
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany