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Type: 
Journal
Description: 
Silicon-germanium thin films have been analyzed by EDS microanalysis in a field emission gun scanning transmission electron microscope (FEG-STEM) equipped with a high angular dark-field detector (STEM/HAADF). Several spectra have been acquired in the same homogeneous area of the cross-sectioned sample by drift-corrected linescan acquisitions. The Ge concentrations and the local film thickness have been obtained by using a previously described Monte Carlo based “two tilt angles” method. Although the concentrations are in excellent agreement with the known values, the resulting confidence intervals are not as good as expected from the precision in beam positioning and tilt angle position and readout offered by our state-of-the-art microscope. The Gaussian shape of the SiKα and GeKα X-ray intensities allows one to use the parametric bootstrap method of statistics …
Publisher: 
Cambridge University Press
Publication date: 
1 Aug 2006
Authors: 

Aldo Armigliato, Roberto Balboni, Rodolfo Rosa

Biblio References: 
Volume: 12 Issue: 04 Pages: 318-321
Origin: 
Microscopy and Microanalysis