-A A +A
A method for the fabrication of a wedge-shaped thin NiO lamella by focused ion beam is reported. The starting sample is an oxidized bulk single crystalline,^ 100& oriented, Ni commercial standard. The lamella is employed for the determination, by analytical electron microscopy at 200 kV of the experimental k~ O-Ni! Cliff-Lorimer~ G. Cliff & GW Lorimer, J Microsc 103, 203–207, 1975! coefficient, according to the extrapolation method by Van Cappellen~ E. Van Cappellen, Microsc Microstruct Microanal 1, 1–22, 1990!. The result thus obtained is compared to the theoretical k~ O-Ni! values either implemented into the commercial software for X-ray microanalysis quantification of the scanning transmission electron microscopy/energy dispersive spectrometry equipment or calculated by the Monte Carlo method. Significant differences among the three values are found. This confirms that for a reliable quantification of binary alloys containing light elements, the choice of the Cliff-Lorimer coefficients is crucial and experimental values are recommended.
Cambridge University Press
Publication date: 
1 Feb 2013

Aldo Armigliato, Stefano Frabboni, Gian Carlo Gazzadi, Rodolfo Rosa

Biblio References: 
Volume: 19 Issue: 1 Pages: 79
Microscopy and Microanalysis