The presence of crossing points in the forward JD-VD curves of 4H-SiC pin diodes is analyzed by means of numerical and analytical models. The analysis allows one to justify the different temperature coefficients reported in the literature for SiC diodes and the interlacing behavior of their JD-VD curves. A simple formula for predicting the position of the crossing-point is proposed.
17 Dec 2013
Volume: 35 Issue: 2 Pages: 244-246
IEEE Electron Device Letters