| Instrument | Equipment |
| Wafer-Level Parametric Characterization System | |
| Wafer-Level Electromigration Characterization System | |
| Field Emission Measurement System | in-house made system |
| Hall Effect System | in-house made system |
| Digital Oscilloscope | LeCroy 6100 |
| Instrument | Equipment |
| Wafer-Level Parametric Characterization System | |
| Wafer-Level Electromigration Characterization System | |
| Field Emission Measurement System | in-house made system |
| Hall Effect System | in-house made system |
| Digital Oscilloscope | LeCroy 6100 |