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Hall measurements under weak persistent photoexcitation in Si-doped Al x Ga1-x As

Type: 
Book
Description: 
Publisher: 
CRC Press
Publication date: 
25 Nov 2020
Authors: 

A Baraldit, C Ghezzi, A Parisini, A Bosacchi, S Franchi

Biblio References: 
Pages: B27-B30
Origin: 
D (X) Centres and other Metastable Defects in Semiconductors, Proceedings of the INT Symposium, Mauterndorf, Austria, 18-22 February 1991
Link: 
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…

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