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Type: 
Conference
Description: 
We propose a method to characterize the main figures of merit of IR thermopile detectors by means of electrical measurements performed at the wafer level. Finite element simulations are adopted in order to compare the results of wafer-level measurements with the actual device responsivity as expected by optical measurements. The employed finite-element model is validated by comparison with experimental data obtained on a micromachined thermal test structure
Publisher: 
IEEE
Publication date: 
1 Jan 2005
Authors: 

Fulvio Mancarella, Alberto Roncaglia, Mara Passini, Michele Sanmartin, Gian Carlo Cardinali, Maurizio Severi

Biblio References: 
Pages: 4 pp.
Origin: 
SENSORS, 2005 IEEE