The 8th edition of the “Pier Giorgio Merli” (Scanning) Transmission Electron Microscopy School, jointly organized by SISM and CNR-IMM, is finally scheduled to be held in early Autumn 2022 as an in-person event. In two full weeks, the School will provide students and researchers engaged in the materials science field (physics, chemistry, engineering) with a qualified introduction to Transmission and Scanning Transmission Electron Microscopy techniques.
In the first week (October 3-7, 2022), after an introduction to TEM and STEM instruments and their working principles, the theoretical background of SAED, CBED, HREM, HAADF-STEM, EELS, EDS and Holography techniques will be detailed. Examples of applications going from strain determination to materials characterization in solids and devices as well as compositional investigations, will be given. Finally, the main principles at the basis of the algorithms for diffraction and TEM and STEM image simulation will be introduced.
In the second week of the School (October 10-14, 2022), the knowledge acquired during the first part will be put into practice. Students, under teacher’s supervision, will operate on the 200 kV Schottky FEG TEM-STEM (FEI Tecnai F20 ST) installed at the CNR-IMM Institute. They will be also trained to the use of some of the available simulation and data processing software essential for (S)TEM work. Finally, examples of plan-view and cross-sectional TEM samples as well as FIB TEM lamellas preparations will be shown with a session in our laboratory and through a virtual stage at the Zeiss CrossBeam 340 installed at the CNR-IMM, respectively.