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Surname: 
Balboni
Firstname: 
Roberto
Position: 
Staff
Profile: 
Researcher
Phone: 
+390516399186
Activity: 
Development and application of electron microscopy techniques for structural analytical characterization of material. This includes conventional scanning and transmission electron microscopy (TEM), EDS and EELS spectroscopy, applied to materials. In particular, electron beam diffraction techniques are applied the study of strain fields in crystals. Recent activity includes the generation and study of vortex and Bessel beams by means of holographic methods and the development of in-situ studies in the TEM.
Curriculum: 

Roberto Balboni is Researcher at the Bologna site of CNR-IMM Institute. He graduated in Physics at the University of Bologna in 1988 and his research activity has been devoted to the characterization of materials mainly using electron microscopy methods, but also by means of X-rays diffraction. He was at Department of Physics of the University of Modena until 1993, where he used scanning and transmission electron microscopy and microanalysis to characterize semiconductor materials and devices. In 1984 he moved to CNR-IMM (formerly LAMEL Institute) where, in addition to electron microscopy, he also worked on X-ray diffraction characterization and modeling in semiconductor and on electromigration issues in metal interconnects. At CNR-IMM he developed the use of convergent beam diffraction analysis to study strain fields at the nanoscale in crystalline materials, by setting up both the experimental procedure and the theoretical modeling and computer code. He participated to the project STREAM (FP5), funded by the EC and coordinated by CNR-IMM Bologna, to set up the procedure and codes for strain analysis in semiconductor structures and devices.
He was responsible for the CNR participation in the project ANNA (FP6), funded by the EC.
He authored more than 80 papers in international journals presented his work on more than 70 international conferences.
He was in the Scientific committees of several international conferences on Microscopy.
He was Director of five editions of the TEM School in Materials Science in Bologna from 2008 to 2016.
He is Vice-President of the Italian Society for Microscopical Sciences from 2007.
He is presently responsible for the Characterization Department at CNR-IMM Bologna.

Scientific Production

Roberto Balboni, Andrea Parisini, Stefano Frabboni, Vittorio Morandi, Marco Vittori Antisari

In memoriam of Dr. Aldo Armigliato

Microscopie [],

Roberto Balboni

Un nuovo sito web per la SISM

Microscopie [],

Vincenzo Grillo, Tyler R Harvey, Federico Venturi, Jordan S Pierce, Roberto Balboni, Frédéric Bouchard, Gian Carlo Gazzadi, Stefano Frabboni, Amir H Tavabi, Zi-An Li, Rafal E Dunin-Borkowski, Robert W Boyd, Benjamin J McMorran, Ebrahim Karimi

Observation of nanoscale magnetic fields using twisted electron beams

Nature Communications [Nature Publishing Group], Volume: 8 Issue: 1 Pages: 689

Vincenzo Grillo, Amir H Tavabi, Emrah Yucelen, Peng-Han Lu, Federico Venturi, Hugo Larocque, Lei Jin, Aleksei Savenko, Gian Carlo Gazzadi, Roberto Balboni, Stefano Frabboni, Peter Tiemeijer, Rafal E Dunin-Borkowski, Ebrahim Karimi

Towards a holographic approach to spherical aberration correction in scanning transmission electron microscopy

Optics express [Optical Society of America], Volume: 25 Issue: 18 Pages: 21851-21860

Vincenzo Grillo, Amir H Tavabi, Federico Venturi, Hugo Larocque, Roberto Balboni, Gian Carlo Gazzadi, Stefano Frabboni, Peng-Han Lu, Erfan Mafakheri, Frédéric Bouchard, Rafal E Dunin-Borkowski, Robert W Boyd, Martin PJ Lavery, Miles J Padgett, Ebrahim Karimi

Measuring the orbital angular momentum spectrum of an electron beam

Nature Communications [Nature Publishing Group], Volume: 8 Pages: 15536

M Canino, R Balboni, A Desalvo, E Centurioni, R Rizzoli, M Bellettato, C Summonte

Local epitaxy from the silicon substrate in silicon–rich SiC during Si–nanocrystals formation

Thin Solid Films [Elsevier], Volume: 628 Pages: 54-60

Federico Venturi, Marco Campanini, Gian Carlo Gazzadi, Roberto Balboni, Stefano Frabboni, Robert W Boyd, Rafal E Dunin-Borkowski, Ebrahim Karimi, Vincenzo Grillo

Phase retrieval of an electron vortex beam using diffraction holography

arXiv preprint arXiv:1703.08496 [],

E Mafakheri, AH Tavabi, P-H Lu, R Balboni, F Venturi, C Menozzi, GC Gazzadi, S Frabboni, A Sit, RE Dunin-Borkowski, E Karimi, V Grillo

Realization of electron vortices with large orbital angular momentum using miniature holograms fabricated by electron beam lithography

Applied Physics Letters [AIP Publishing], Volume: 110 Issue: 9 Pages: 093113

E Mafakheri, AH Tavabi, P-H Lu, R Balboni, F Venturi, C Menozzi, GC Gazzadi, S Frabboni, A Sit, RE Dunin-Borkowski, E Karimi, V Grillo

Realization of electron vortices with large orbital angular momentum using miniature holograms fabricated by electron beam lithography

Applied Physics Letters [AIP Publishing], Volume: 110 Issue: 9 Pages: 093113

Amir H Tavabi, Federico Venturi, Hugo Larocque, Roberto Balboni, Gian Carlo Gazzadi, Stefano Frabboni, Peng-Han Lu, Erfan Mafakheri, Frédéric Bouchard, Rafal E Dunin-Borkowski, Robert W Boyd, Martin PJ Lavery, Miles J Padgett, Ebrahim Karimi

Measuring an electron beam's orbital angular momentum spectrum

arXiv preprint arXiv:1609.09129 [],

Vincenzo Grillo, Jérémie Harris, Gian Carlo Gazzadi, Roberto Balboni, Erfan Mafakheri, Mark R Dennis, Stefano Frabboni, Robert W Boyd, Ebrahim Karimi

Generation and application of bessel beams in electron microscopy

Ultramicroscopy [North-Holland], Volume: 166 Pages: 48-60

V Grillo, AH Tavabi, F Venturi, H Larocque, R Balboni, GC Gazzadi, S Frabboni, PH Lu, E Mafakheri, F Bouchard, RE Dunin-Borkowski

Measuring an electron beam’s orbital angular momentum spectrum

arXiv preprint arXiv:1609.09129 [],

Vincenzo Grillo, Ebrahim Karimi, Roberto Balboni, Gian Carlo Gazzadi, Federico Venturi, Stefano Frabboni, Jordan S Pierce, Benjamin J McMorran, Robert W Boyd

Electron holograms encoding amplitude and phase for the generation of arbitrary wavefunctions

Microscopy and Microanalysis [Cambridge University Press], Volume: 21 Pages: 503

Erfan Mafakheri, Vincenzo Grillo, Roberto Balboni, Gian Carlo Gazzadi, Claudia Menozzi, Stefano Frabboni, Ebrahim Karimi, Robert W Boyd

Holograms for the Generation of Vortex States with L= 500h Fabricated by Electron Beam Lithography

Microscopy and Microanalysis [Cambridge University Press], Volume: 21 Pages: 667

Vincenzo Grillo, Jordan S Pierce, Ebrahim Karimi, Tayler R Harvey, Roberto Balboni, Gian Carlo Gazzadi, Erfan Mafakheri, Federico Venturi, Benjamin J McMorran, Stefano Frabboni, Robert W Boyd

Structured Electron Beam Illumination: A New Control Over the Electron Probe Weird Probes and New Experiments

Microscopy and Microanalysis [Cambridge University Press], Volume: 21 Pages: 25

Vincenzo Grillo, Ebrahim Karimi, Roberto Balboni, Gian Carlo Gazzadi, Stefano Frabboni, Erfan Mafakheri, Robert W Boyd

Experiments and Potentialities for the use of Bessel Beam in Superresolution STEM

Microscopy and Microanalysis [Cambridge University Press], Volume: 20 Issue: S3 Pages: 384-385

Vincenzo Grillo, Ebrahim Karimi, Roberto Balboni, Gian Carlo Gazzadi, Stefano Frabboni, Erfan Mafakheri, Robert W Boyd

Innovative Phase Plates for Beam Shaping

Microscopy and Microanalysis [Cambridge University Press], Volume: 20 Issue: S3 Pages: 228-229

P Ingenhoven, A Anopchenko, A Tengattini, D Gandolfi, F Sgrignuoli, G Pucker, Y Jestin, L Pavesi, R Balboni

Quantum effects in silicon for photovoltaic applications

physica status solidi (a) [], Volume: 210 Issue: 6 Pages: 1071-1075

M Barozzi, S Gennaro, M Bersani, L Vanzetti, Y Jestin, G Pucker, S Milita, R Balboni

Structural analysis and depth profiling of nanometric SiO2/SRO multilayers

Surface and Interface Analysis [], Volume: 45 Issue: 1 Pages: 373-375

S Frabboni, V Grillo, GC Gazzadi, R Balboni, R Trotta, A Polimeni, M Capizzi, F Martelli, S Rubini, G Guzzinati, F Glas

Convergent beam electron-diffraction investigation of lattice mismatch and static disorder in GaAs/GaAs1-xNx intercalated GaAs/GaAs1-xNx:H heterostructures

Applied Physics Letters [AIP], Volume: 101 Issue: 11 Pages: 111912-111912-4

E Agocs, P Petrik, S Milita, L Vanzetti, S Gardelis, AG Nassiopoulou, G Pucker, R Balboni, M Fried

Optical characterization of nanocrystals in silicon rich oxide superlattices and porous silicon

Thin Solid Films [Elsevier], Volume: 519 Issue: 9 Pages: 3002-3005

Roberto Balboni, Gabriella Borionetti, Luigi Moiraghi, Giuseppe Vaccari, Maria Luisa Polignano, Gian Pietro Carnevale, Francesco Cazzaniga, Isabella Mica, Francesca Sammiceli

Improved TEM Sample Preparation by Low Energy FIB for Strain Analysis by Convergent Beam Electron Diffraction

ECS Transactions [The Electrochemical Society], Volume: 25 Issue: 3 Pages: 385-396

Silfredo J Bohórquez, José M Asua

Particle nucleation in high solids batch miniemulsion polymerization stabilized with a polymeric surfactant

Journal of Polymer Science Part A: Polymer Chemistry [Wiley Subscription Services, Inc., A Wiley Company], Volume: 46 Issue: 19 Pages: 6407-6415

Aldo Armigliato, Roberto Balboni, Rodolfo Rosa

Application of the parametric bootstrap method to determine statistical errors in quantitative X‐ray microanalysis of thin films

Journal of Microscopy [Blackwell Publishing Ltd], Volume: 228 Issue: 1 Pages: 1-10

Aldo Armigliato, Roberto Balboni, Andrea Parisini

Structural and Analytical Characterization by Scanning Transmission Electron Microscopy of Silicon-based Nanostructures

ECS Transactions [The Electrochemical Society], Volume: 10 Issue: 1 Pages: 57-64

A Spessot, S Frabboni, R Balboni, A Armigliato

Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high‐order Laue zone line profiles

Journal of Microscopy [Blackwell Publishing Ltd], Volume: 226 Issue: 2 Pages: 140-155

A Spessot, S Frabboni, R Balboni, A Armigliato

Strain field reconstruction in shallow trench isolation structures by CBED and LACBED

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms [North-Holland], Volume: 253 Issue: 1 Pages: 149-153

Aldo Armigliato, Roberto Balboni, Rodolfo Rosa

Quantitative thin-film X-ray microanalysis by STEM/HAADF: statistical analysis for precision and accuracy determination

Microscopy and Microanalysis [Cambridge University Press], Volume: 12 Issue: 04 Pages: 318-321

Aldo Armigliato, Alessio Spessot, Roberto Balboni, Alessandro Benedetti, Gianpietro Carnevale, Stefano Frabboni, Gianfranco Mastracchio, Giuseppe Pavia

Convergent beam electron diffraction investigation of strain induced by Ti self-aligned silicides in shallow trench Si isolation structures

Journal of applied physics [AIP Publishing], Volume: 99 Issue: 6 Pages: 064504

A Armigliato, A Spessot, R Balboni, A Benedetti, GP Carnevale, S Frabboni, G Mastracchio, G Pavia

TEM/CBED investigation of strain induced by Ti-salicides in shallow trench Si isolation structures

J. of Applied Physics [], Volume: 99 Pages: 64504

A Armigliato, R Balboni, S Frabboni

Improving spatial resolution of convergent beam electron diffraction strain mapping in silicon microstructures

Applied Physics Letters [AIP], Volume: 86 Issue: 6 Pages: 063508-063508-3

L Nasi, C Ferrari, A Lanzi, L Lazzarini, R Balboni, G Clarke, M Mazzer, C Rohr, P Abbott, KWJ Barnham

Wavy growth onset in strain-balanced InGaAs multi-quantum wells

Journal of crystal growth [North-Holland], Volume: 274 Issue: 1 Pages: 65-72

D Marini, GB Montanari, F Mancarella, M Ferri, R Balboni, G Bolognini

Study of birefringence and strain distribution in silicon waveguides and coupling structures

Fotonica AEIT Italian Conference on Photonics Technologies, 2015 [IET], Pages: 1-4

GB Montanari, F Mancarella, R Balboni, D Marini, F Corticelli, M Sanmartin, M Ferri, G Bolognini

Induced strain in silicon waveguides and couplers

Silicon Photonics X [International Society for Optics and Photonics], Volume: 9367 Pages: 93671L

D Marini, GB Montanari, F Mancarella, M Ferri, R Balboni, G Bolognini

Study of induced strain in silicon rib structures

11th International Conference on Group IV Photonics (GFP) [IEEE], Pages: 195-196

Nicola Andriolli, Isabella Cerutti, Paolo Pintus, Mirco Scaffardi, D Marini, GB Montanari, F Mancarella, M Ferri, R Balboni, Gabriele Bolognini

Challenges and progress toward a silicon-based multi-microring optical network-on-chip

2014 European Conference on Networks and Communications (EuCNC) [IEEE], Pages: 1-5

D Marini, GB Montanari, F Mancarella, M Ferri, R Balboni, G Bolognini

Lattice deformations in strained-silicon rib structures for photonic devices

2014 Fotonica AEIT Italian Conference on Photonics Technologies [IEEE], Pages: 1-3

C Summonte, S Mirabella, R Balboni, A Desalvo, I Crupi, F Simone, A Terrasi

Growth and characterization of Si nanodot multilayers in SiC matrix

23rd European Photovoltaic Solar Energy Conference, 1-5 September 2008, Valencia, Spain [], Pages: 730-733